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High-Sensitivity AES-8000 AC/DC Arc Emission Spectrometer - China Suppliers & Factory for Trace Element Analysis
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High-Sensitivity AES-8000 AC/DC Arc Emission Spectrometer - China Suppliers & Factory for Trace Element Analysis

The AES-8000 AC-DC Arc Emission Spectrometer is a cutting-edge analytical instrument that utilizes high-sensitivity CMOS technology for precise detection. It offers full-spectrum acquisition across a wide wavelength range, making it an invaluable tool in various industries, including geology, non-ferrous metals, and chemicals. This spectrometer excels at directly analyzing powder samples without requiring sample dissolution, providing an ideal solution for both qualitative and quantitative analysis of trace elements in insoluble powders. As a leading manufacturer in China, we pride ourselves on supplying state-of-the-art spectrometry equipment directly from our factory, ensuring high quality and performance for our clients

    🔬 Typical Application
    1. Simultaneous determination of Ag, Sn, B, Mo, Pb, Zn, Ni, Cu and other elements in geological samples; it can also be used for the detection of trace precious metal elements in geological samples (after separation and enrichment).
    2. Determination of several to dozens of impurity elements in high-purity metals and high-purity oxides, powder samples such as tungsten, molybdenum, cobalt, nickel, tellurium, bismuth, indium, tantalum, niobium, etc.
    3. Analysis of trace and trace elements in insoluble powder samples such as ceramics, glass, coal ash, etc.
    🌍 One of the indispensable supporting analysis programs for geochemical exploration samples
    AES-8000 AC/DC ARC EMISSION SPECTROMETER - Geochemical Application
    ⚗️ Ideal for detection of impurity components in high-purity substances
    AES-8000 AC/DC ARC EMISSION SPECTROMETER - High-purity Detection
    ⚙️ Features
    🔭 Efficient Optical Imaging System

    Ebert-Fastic optical system and three-lens optical path are adopted to effectively remove stray light, eliminate halo and chromatic aberration, reduce background, enhance light gathering ability, good resolution, uniform spectral line quality, and fully inherit the optical path of a one-meter grating spectrograph advantages.

    • Compact optical structure and high sensitivity
    • Good image quality, straight focal plane
    • Inverted line dispersion rate 0.64nm/mm
    • The theoretical spectral resolution is 0.003nm (300nm)
    💡 High-performance Linear Array CMOS Sensor and High-speed Acquisition System
    • Using UV-sensitive CMOS sensor, high sensitivity, wide dynamic range, small temperature drift; no need for coating, no device spectrum broadening effect, no film aging problem.
    • The high-speed multi-CMOS synchronous acquisition and data processing system based on FPGA technology not only completes the automatic measurement of analytical element spectral lines, but also realizes the functions of automatic calibration of synchronous spectral lines and automatic background subtraction.
    AC and DC Arc Excitation Light Source: It is convenient to switch between AC and DC arcs. According to different samples to be tested, selecting the appropriate excitation mode is beneficial to improve the analysis and test results. For non-conductive samples, select AC mode, and for conductive samples, select DC mode.

    🎯 Electrode Automatic Alignment

    The upper and lower electrodes automatically move to the designated position according to the software parameter settings, and after the excitation is completed, remove, and replace the electrodes, which is easy to operate and has high alignment accuracy.

    AES-8000 AC DC ARC EMISSION SPECTROMETER - Electrode Automatic Alignment

    👁️ Convenient Viewing Window

    The patented electrode imaging projection technology displays all the excitation process on the observation window in front of the instrument, which is convenient for users to observe the excitation of the sample in the excitation chamber, and helps to understand the properties and excitation behavior of the sample.

    AES-8000 AC DC ARC EMISSION SPECTROMETER - Viewing Window
    💻 Powerful Analysis Software
    • Real-time automatic calibration of spectral lines to eliminate the influence of instrument drift
    • Background is automatically deducted to reduce the interference of human factors
    • Through the spectral line separation algorithm, reduce the influence of spectral interference
    • Automatic switching of multi-spectrum determination to broaden the range of detection content
    • The combination of two fitting methods improves the accuracy of sample analysis
    • Abundant spectral line information, broadening the application field of analysis
    • Special analysis software, suitable for different sample testing requirements
    • Convenient data post-processing function shortens the experimental process and makes data processing more flexible
    🛡️ Safety Protection
    • The cooling circulating water flow monitoring of the electrode clip can avoid the high temperature burning of the electrode clip
    • Activate the safety interlocking of the chamber door to protect the safety of operators
    📋 Parameters
    Optical path form Vertically symmetrical Ebert-Fastic type Current range 2~20A (AC) / 2~15A (DC)
    Plane Grating Lines 2400 pieces/mm Excitation light source AC/DC arc
    Optical path focal length 600mm Weight About 180Kg
    Theoretical spectrum 0.003nm (300nm) Dimensions (mm) 1500(L) × 820(W) × 650(H)
    Resolution 0.64nm/mm (first class) Constant temperature of spectroscopic chamber 35°C ± 0.1°C
    Falling Line Dispersion Ratio Synchronous high-speed acquisition system based on FPGA technology for high-performance CMOS sensor Environmental conditions Room temperature 15°C ~ 30°C; Relative humidity < 80%
    ❓ Frequently Asked Questions
    Q What types of samples can the AES-8000 AC/DC Arc Emission Spectrometer analyze?
    The AES-8000 is suitable for a wide range of samples, including geological samples (for multi-element and trace precious metal detection), high-purity metals and oxides (such as tungsten, molybdenum, cobalt, nickel), and insoluble powder samples like ceramics, glass, and coal ash. It is especially well-suited for geochemical exploration programs.
    Q What is the difference between AC and DC arc excitation modes?
    The AES-8000 supports both AC and DC arc excitation and allows easy switching between the two. AC mode is recommended for non-conductive samples, while DC mode is more suitable for conductive samples. Choosing the correct mode helps improve analysis accuracy and test results.
    Q How does the CMOS sensor improve performance compared to traditional detectors?
    The UV-sensitive CMOS sensor used in the AES-8000 offers high sensitivity, a wide dynamic range, and minimal temperature drift. Unlike traditional detectors, it does not require a coating, eliminates device spectrum broadening effects, and avoids film aging issues — ensuring long-term, stable analytical performance.
    Q What are the key optical specifications of the AES-8000?
    The AES-8000 features a vertically symmetrical Ebert-Fastic optical system with a 600mm focal length, 2400 lines/mm plane grating, a theoretical spectral resolution of 0.003nm at 300nm, and an inverted line dispersion rate of 0.64nm/mm. These specifications ensure excellent image quality, high sensitivity, and minimal stray light interference.
    Q What safety features does the AES-8000 include?
    The AES-8000 is equipped with two key safety mechanisms: a cooling circulating water flow monitoring system for electrode clips to prevent high-temperature damage, and a safety interlocking system for the chamber door to protect operators during the excitation process.
    Q What are the environmental and installation requirements for the AES-8000?
    The AES-8000 requires an ambient temperature between 15°C and 30°C and a relative humidity below 80%. It weighs approximately 180 kg, with dimensions of 1500(L) × 820(W) × 650(H) mm. The spectroscopic chamber is maintained at a constant temperature of 35°C ± 0.1°C to ensure measurement stability.